Two-Day Course on Quantitative Microscopy Under the ASM-IIM Programme Teach the Teacher at Chennai on December 12-13, 2013
Two-Day Course on
Quantitative Microscopy
Under
the ASM-IIM Programme
Teach
the Teacher
December 12-13, 2013
Venue:
IIT Madras
By
Prof. Arun Gokhale, FASM
School of Materials Science and Eng.
Georgia Institute of Technology, USA
Organised Jointly
by
ASM International Chennai
Chapter,
Indian Institute of Metals Chennai Chapter
&
Dept. of Metallurgical and
Materials Eng.
Indian Institute of Technology
Madras
Theme and Course Description:
Microstructure controls the properties of materials to
a large extent. An understanding of the microstructure-property correlations is
essential for anyone dealing with materials, working in an academic
institution, R&D laboratory or an industry. Quantitative evaluation of
microstructure can help in quantitative prediction of properties of materials.
The present course deals with not only the basic principles of quantitative
microscopy but also gives the participants hands-on experience on quantifying
the microstructure.
Course Content:
1. Microstructural geometry and statistical sampling of
microstructures
2. Estimation of volume fraction of constituent phases in
isotropic and anisotropic microstructures, and microstructures having gradients
3. Hands-on estimation
of volume fraction
4. Estimation of Total Surface area per unit volume in
isotropic microstructures
5. Hands-on estimation
of microstructural surface area
6. Estimation of surface area in anisotropic
microstructures
7. Hands-on
estimation of surface area in anisotropic microstructures
8. Estimation of total length per unit volume
9. Unbiased estimation of number density in 2D and 3D
microstructures
10. Topology of grain structure and grain size
11. Hands-on measurements of grain size and number density
12. Reconstruction and visualization of three-dimensional
microstructures
13. Quantitative microscopy using EBSD (by Dr. V.
Subramanya Sarma, IIT Madras).
About Prof.
Gokhale:
Prof. Arun Gokhale received
his BTech (1970) and MTech (1972) in Metallurgical Engineering from Indian Institute
of Technology, Kanpur, and PhD (1977) in Materials Science from University of
Florida. He is internationally renowned for his contributions in the
development and applications of quantitative metallography, stereology, and
digital image processing for mathematical representation of materials and
biological microstructures; modeling and simulations of microstructures for
materials design, and applications of quantitative fractography for
characterization of fracture. He received 2013
Henry Clifton Sorby award of International Metallography Society, which is
a life-time-achievement award for contributions in the field of metallurgy. He
is a Fellow of ASM International. He has written chapters in ASM Metals Handbook Vol. 9 (Failure Analysis and
Prevention, 2002 edition), and Vol. 11 (Metallography and Microstructures, 2004
edition).
To Whom the Course would be Useful:
This programme
is highly beneficial for the faculty members of various institutions teaching
courses related to metallurgy and materials science, engineers in industry involved
in design, development and quality control of materials and researchers in
R&D labs involved in the study of microstructure-property correlations.
Registration Fee:
Students: Rs.
2000/-
Faculty
Members: Rs. 3000/-
Participants
from Industry and R&D Labs: Rs. 4000/-
(More
than three participants from an organization can avail 20% concession. Those
who pay full registration fee will be given free membership of IIM for one
year.)
The total number of participants will be restricted to
30. Hence the participation would be on a first-cum-first-serve basis.
DD/Cheque should be in
favour of “Indian Institute of Metals
Chennai Chapter” payable at Chennai.
The filled-in registration forms
can be sent to:
Prof. B.S. Murty
Department of Metallurgical
and Materials engineering
Indian Institute of
Technology Madras
Chennai 600036
E-mail: murty@iitm.ac.in, murty.iitm@gmail.com
Phone: 044-22574754,
09444077006
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