Friday, February 26, 2010

Practical pattern recognition workshop for Nondestructive testing-NDT

THE WORKSHOP
This workshop introduces the practical aspects of pattern recognition. Using the group`s ICEPAK as a framework, the workshop covers the theory and applications of statistical pattern recognition and neural networks. Pattern recognition methods help you discover the depth of your NDT data and improve the ability to discriminate among the sources of the signal such as types of defects and noise with a quantified assessment of the recognition rate. These tools extract much more information from the signals and images than the human inspector can and, therefore, make the NDT data much more valuable.

WHO SHOULD ATTEND
* Any inspection practitioner who wants to take advantage of the full information content of the signals and images produced by nondestructive testing systems.
* Inspectors, Scientists and Engineers involved in actual inspection, in the design and application of signal and image interpretation systems and control systems for nondestructive testing
* Basic Researchers in the engineering, physical, education, environmental and military sciences who wish to apply advanced signal and image analysis and interpretation methods
* Test Engineers and Technicians looking for faster and more effective ways to develop automated testing and control systems.

Depending on the people in the workshop, the proportion of theory and practice is paced to the individual needs of each attendee. Workshop numbers are limited to permit the instructors to work with each attendee on problems of his or her own interest. Attendees will gain a sound basis for evaluating the potential of current pattern recognition technology for their applications as well as the ability to rapidly implement a. range of classifier technologies.

PREREQUISITE BACKGROUND
The workshop provides attendees with no background in pattern recognition with the necessary terminology and theoretical background. For the experienced users, the workshop goes beyond theory to focus on applications.

HANDS-ON
Bring your own data for use during the hands-on sessions. If you seek a fast and cost-effective way to design and implement classifiers for your signal and image interpretation applications, you'll find this three-day workshop worthwhile. Participants at previous workshops have developed and used a classifier on their own data in less than a few hours!

The workshop instructors have plenty of data to introduce attendees who are exploring the field for the first time.

WORKSHOP CONTENT
The workshop begins with an overview of the pattern recognition field and proceeds to introduce a theoretical background. A hands-on introduction session at the computer late in the first morning begins alternating applied and theoretical sessions.

WORKSHOP TOPICS

1. Overview of Artificial Intelligence
2. Terminology
3. Knowledge-Based Systems
4. When and When Not to use AI
5. Supervised Learning
6. Unsupervised Learning
7. Pattern Recognition Methods
8. Statistical Pattern Classifiers
9. Neural Networks
10. Waveform Representation
11. Waveform Transformations
12. Feature Extraction
13. Feature Set Optimization
14. Image Representation
15. Classifier Design
16. On-line Classification
17. Multi-Channel Data Acquisition
18. System Hardware and Software Design
19. Case Studies

INSTRUCTORS
Dr. D. Robert Hay has pioneered in the application of pattern recognition systems for a wide range of engineering and medical applications. He has worked in the field for over 40 years.

Mr. Roger W. Y. Chan is a leading designer of pattern recognition and artificial intelligence systems at the hardware and software levels. His areas of expertise are in statistical pattern recognition and neural networks and in feature extraction and feature set optimization. He has worked at the leading edge of applying pattern recognition methods to engineering applications for over thirty years.

WORKSHOP MATERIALS
When you attend the workshop you receive an authorized version of ICEPAK® to install on your computer and take home and the Users Manual with Theory of Operations that provides a comprehensive background on pattern recognition and other Structural Insights® Application Notes.

TIME AND PLACE
The Workshop will take in Montreal, Canada at the following times:

June 15 to 17, 2010

July 13 to 15, 2010

August 17 to 19, 2010

Select the period best suited to you. While not relevant to the course itself, this is an ideal time to visit Montreal, the gateway to North America. We`ll see that you experience the best of Montreal and, if you wish, the surrounding areas.

WORKSHOP FEE
In the scheduled sessions the fee is US $1200 per person or US$900 each for group sessions of five or more attendees. The course can be offered on site at client facilities.

HOTEL INFORMATION
Hotel accommodation and meals are not included in the registration fee. Your accommodations must be arranged directly with a hotel. Information on the location of the workshop in each city and area hotels will be available at the time you register for the workshop and we would be pleased to help in arranging accommodation.

CONTACT
To let us know of your interest and to arrange a convenient workshop schedule or for more information on the workshop, contact:

Structural Insights®
TISEC Inc
2755 Pitfield Boulevard
Montreal
H4S 1T2
Ph 514 334 8430
Fx 514 334 7017
www.structuralinsights.com
matt@structuralinsights.com


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